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专利名称：3D Microscope Calibration
发明人：JAMES AUSTIN BESLEY,ANDREW DOCHERTY申请号：US15034277申请日：20141106
公开号：US20160282598A1公开日：20160929
专利附图：
摘要：A method calibrates a microscope using a test pattern by capturing a pluralityof images of the test pattern with the microscope. The test pattern has a plurality ofuniquely identifiable positions across a plurality of repeating and overlapping 2D sub-patterns. The method determines an image contrast metric from the captured image in a
selected patch of the test pattern and a reference contrast metric in the correspondingregion; and (iii) determines a normalised contrast metric using the reference contrastmetric and the image contrast metric. The method estimates depths of the two capturedimages at the plurality of positions using the normalised contrast metrics and a set ofpredetermined calibration data for a stack of images captured using the test pattern at arange of depths, and calibrates the microscope using a comparison of the determineddepth estimates for the at least two images.
申请人：CANON KABUSHIKI KAISHA
地址：Ohta-ku, Tokyo JP
国籍：JP
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